Programmable Linear Hall Sensor with Sent Output

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HAL2831UT-A

Part #:
HAL2831UT-A
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Product Information

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The HAL 283x are members of the Micronas varioHAL® (HAL 28xy) family of programmable linear Hall-effect sensors. The sensors feature a digital SENT interface (Single Edge Nibble Transmission). This interface enables a fast and robust data transfer in harsh automotive environments. The implementation of the interface complies with the SAE J2716 SENT standard release 2010-01.

Each SENT message consists of a sequence of pulses. In one protocol, the sensor transmits the magnetic field information, a status information of the sensor, and a CRC checksum for safety reasons. Optional, a pause pulse is added at the end of each protocol to enable a synchronous transmission. Major characteristics like magnetic field range, sensitivity, offset, and the temperature coefficients of sensitivity and offset can easily be adjusted to the magnetic circuit by programming the non-volatile memory.

The digital signal processing is of great benefit because analog offsets, temperature shifts, and mechanical stress do not degrade digital signals. The HAL 283x is available in the very small leaded package TO-92UT
 

Features

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High-precision linear Hall-effect sensor
Spinning current offset compensation
20 bit digital signal processing
Output resolution up to 16 bit
Magnetic measurement range over temperature adjustable from 24 mT up to 96 mT
Sample period programmable from 0.5 ms to 33 ms
Various sensor parameter are programmable: offset, sensitivity, temperature compensation for sensitivity (2nd order) and offset (1st order), etc.
Programming and operation of multiple sensors at the same supply line
Biphase-M interface (programming mode)
Non-volatile memory with lock function
SENT clock tick time programmable between 2 s and 17.75 s
Pulse low time programmable between 3 and 6.75 clock ticks
Sample accurate transmission of magnetic field information
Transmission of temperature and device information by serial data messages in the status nibble
Open-drain output with slew rate control (load independent)
On-board diagnostics (overvoltage, output current, overtemperature, signal path overflow)
Power-on self-test covering all memories and full signal path from Hall plates to SENT output
ESD protection at DIO pin
Reverse voltage and ESD protection at VSUP pin
High immunity against mechanical stress, ESD, and EMC
AECQ-100 rev. G qualified
 

Documents

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Datasheet

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